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X-ray photoelectron spectroscopy (XPS), KRATOS AXIS Supra (Ł-IMiF)

27 August 2022

X-ray photoelectron spectroscopy (XPS) is a surface sensitive analytical technique. A sample is irradiated with a beam of X-rays which then causes an emission of electrons. Their number and kinetic energies are measured which provide information about elemental composition, chemical and electronic state of a sample. The 500 mm Rowland circle monochromated Al Kα X-ray source provides high sensitivity and very high energy resolution which allows detection of elements in parts per thousand range and unambiguous identification of chemical shifts. Additionally, equipped with Ar ion gun which enables depth profiling and sample cleaning.

X-ray photoelectron spectroscopy (XPS), KRATOS AXIS Supra (Ł-ITME)