The AFM is a type of scanning probe microscopy (SPM) which allows producing microscopic maps of sample surface shape, as well as its physical properties, such as rubbing, adhesion, decomposition of electrostatic charge, conductivity, structure of magnetic domains or thermal conductance. 

This AFM has two exchangeable scanning heads: Dimension FastScan and Dimension Icon. The Dimension FastScan atomic force microscope delivers extreme imaging speed without sacrificing Dimension Icon resolution and performance. This innovation enables radically faster time of publishable data for all levels of AFM expertise. This system scans fast without loss of resolution or force control. The measurements can be carried out in air or liquid.


27 August 2022

Atomic Force Microscope (AFM), Dimension FastScan with ScanAsyst, Bruker, (Ł-ITME)

  1. pl
  2. en

01-919  Warsaw
133 Wólczyńska St. 


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