Functional Materials Technology Group
Optical Nanocharacterization Group
Inverse Materials Design Group
Next-Generation Energy Systems Group
Biophotonic Applications Group
Solar Energy Conversion Group
Oxide Single Crystals Group
Ensemble3 sp. z o.o.
133 Wólczyńska St.
The AFM is a type of scanning probe microscopy (SPM) which allows producing microscopic maps of sample surface shape, as well as its physical properties, such as rubbing, adhesion, decomposition of electrostatic charge, conductivity, structure of magnetic domains or thermal conductance.
This AFM has two exchangeable scanning heads: Dimension FastScan and Dimension Icon. The Dimension FastScan atomic force microscope delivers extreme imaging speed without sacrificing Dimension Icon resolution and performance. This innovation enables radically faster time of publishable data for all levels of AFM expertise. This system scans fast without loss of resolution or force control. The measurements can be carried out in air or liquid.