I agree my information will be processed in accordance with the ENSEMBLE³ Privacy Policy.


Sign up for our newsletter

Email address added to mailing list. 
  • Please complete all fields!


Ensemble3 sp. z o.o.

01-919  Warsaw
133 Wólczyńska St.

NIP 1182211096

KRS 0000858669 

  1. pl
  2. en

Atomic Force Microscope (AFM), Dimension FastScan with ScanAsyst, Bruker, (Ł-IMiF)

27 August 2022

The AFM is a type of scanning probe microscopy (SPM) which allows producing microscopic maps of sample surface shape, as well as its physical properties, such as rubbing, adhesion, decomposition of electrostatic charge, conductivity, structure of magnetic domains or thermal conductance. 

This AFM has two exchangeable scanning heads: Dimension FastScan and Dimension Icon. The Dimension FastScan atomic force microscope delivers extreme imaging speed without sacrificing Dimension Icon resolution and performance. This innovation enables radically faster time of publishable data for all levels of AFM expertise. This system scans fast without loss of resolution or force control. The measurements can be carried out in air or liquid.